Surface Mount Test Clip

The IC Test-Clip for fast, safe access to Plastic Leaded Chip Carrier (PLCC) style integrated circuits

Our new surface Mount Test Clip is truly the state Of the art for testing Plastic Leaded Chip Carrier (PLCC) style integrated circuits. The unique action wedge design with all four sides opening simultaneously provides a faster and easier attachment to the PLCC.

The helical compression spring and insulating contact combs insure integrity in contact when testing. Our narrow body design allows components to be tested with as little as 2,54 mm (0,1") lead-to-lead spacing, side. Stackable at 0,200" lead-to-lead spacing.

Probe access points are immediately visible for fast and safe individual lead testing, while staggered contact rows on 0,100" centers allow for easy probe attachment and help prevent accidental shorting of adjacent probes, Industry standard .025" square contact pins permit easy attachment of female socket connectors or wire wrapping.


Get the full Test-Clip catalog here: 

Number of pins

20
28
44
52
68
84

20
28
44
52
68
84
Part Number

923670-20
923670-28
923670-44
923670-52
923670-68
923670-84

923675-20
923675-28
923675-44
923675-52
923675-68
923675-84
Description

Alloy
Alloy
Alloy
Alloy
Alloy
Alloy

Gold
Gold
Gold
Gold
Gold
Gold



Logical                Connections A P Products Test Clip cable assemblies
Logical Connection Remote test equipment can be easily connected to a PCB when the performance proven A P Products IC Test-Clip is combined with our complete, tested, ready-to-use cable assembly. We call this combination "The Logical Connection". It is the ideal connection from a logic analyzer to an IC. On one end, a pair of single-row socket connectors attach to the pins of a connector-compatible model Test Clip. On the other end the cable is left open for an easy attachment of customer specific connectors. Logical Connections with preinstalled connectors are also available.



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Last update March 1, 1999